Electrical characterization of controlled and unintentional modified metal–organic contacts

A method to characterize metal–organic contacts subjected to controlled technological treatments or unintentional degradation processes is proposed. The procedure is useful to characterize different fundamental aspects of a metal–organic structure such as the height of the interface energy barrier, the presence of impurities or trapping effects and the carrier mobility. Current–voltage curves in organic diodes are analyzed and the value of the …