Conference
Application of multivariate statistical analysis to complex grain boundary microstructures
Authors
Chevalier EJA; Botton GA
Editors
Kiely CJ
Series
INSTITUTE OF PHYSICS CONFERENCE SERIES
Pagination
pp. 175-178
Publisher
IOP PUBLISHING LTD
Publication Date
January 1, 1999
ISBN-10
0-7503-0577-0
Name of conference
Biennial Meeting of the Electron-Microscopy-and-Analysis-Group of the Institute of Physics (EMAG 99)
Conference place
UNIV SHEFFIELD, SHEFFIELD, ENGLAND
Conference start date
August 24, 1999
Conference end date
August 27, 1999
Conference proceedings
ELECTRON MICROSCOPY AND ANALYSIS 1999
Issue
161
ISSN
0951-3248