Journal article
Element Specific Monolayer Depth Profiling
Abstract
The electronic phase behavior and functionality of interfaces and surfaces in complex materials are strongly correlated to chemical composition profiles, stoichiometry and intermixing. Here a novel analysis scheme for resonant X-ray reflectivity maps is introduced to determine such profiles, which is element specific and non-destructive, and which exhibits atomic-layer resolution and a probing depth of hundreds of nanometers.
Authors
Macke S; Radi A; Hamann‐Borrero JE; Verna A; Bluschke M; Brück S; Goering E; Sutarto R; He F; Cristiani G
Journal
Advanced Materials, Vol. 26, No. 38, pp. 6554–6559
Publisher
Wiley
Publication Date
10 2014
DOI
10.1002/adma.201402028
ISSN
0935-9648