Conference
Fast Anomaly Detection in Micro Data Centers Using Machine Learning Techniques
Abstract
This paper proposes a new approach to fast detection of abnormal behaviour of cooling and IT systems in micro data centers (MDCs) based on machine learning (ML) techniques. Conventional protection of MDCs focuses on monitoring individual parameters such as temperature at different locations and when these parameters reaches certain high values, then alarm will be triggered. This paper employs ML techniques to extract normal and abnormal …
Authors
Nanekaran NP; Esmalifalak M; Narimani M
Volume
1
Pagination
pp. 86-93
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
July 23, 2020
DOI
10.1109/indin45582.2020.9442233
Name of conference
2020 IEEE 18th International Conference on Industrial Informatics (INDIN)