Chapter
Absorption‐induced enhancement of X‐ray contrast by soft X‐ray emissions
Abstract
Contrast in atomically‐resolved EDX elemental mapping in real space or in reciprocal space channelling patterns, derived from characteristic X‐ray emissions excited by a given probe, is generated by the variation in emission rate as the incident wave function is scanned over the target atoms in a crystal. This is achieved either by raster scanning a focused coherent probe in real space at a fixed orientation (conventional EDX mapping), or by a …
Authors
Rossouw C; Rossouw D; Korinek A; Woo S; Botton G
Book title
European Microscopy Congress 2016: Proceedings
Pagination
pp. 821-822
Publisher
Wiley
DOI
10.1002/9783527808465.emc2016.6458