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Absorption‐induced enhancement of X‐ray contrast...
Chapter

Absorption‐induced enhancement of X‐ray contrast by soft X‐ray emissions

Abstract

Contrast in atomically‐resolved EDX elemental mapping in real space or in reciprocal space channelling patterns, derived from characteristic X‐ray emissions excited by a given probe, is generated by the variation in emission rate as the incident wave function is scanned over the target atoms in a crystal. This is achieved either by raster scanning a focused coherent probe in real space at a fixed orientation (conventional EDX mapping), or by a …

Authors

Rossouw C; Rossouw D; Korinek A; Woo S; Botton G

Book title

European Microscopy Congress 2016: Proceedings

Pagination

pp. 821-822

Publisher

Wiley

DOI

10.1002/9783527808465.emc2016.6458

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