Characterization of InSb nanopillars for field emission applications

A piezoelectrically driven metallic nanoprobe is installed inside a scanning electron microscope to perform local characterization of the field emission properties of InSb nanopillars. The tip-shaped anode can be precisely positioned at sub-micron distances from the emitters to collect electrons from areas as small as 1μm2 under the application of an external bias up to 100 V. Current-voltage characteristics are measured for cathode-anode …