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Modified Tip-enhanced Raman spectroscopy to detect...
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Modified Tip-enhanced Raman spectroscopy to detect a monolayer of Reverse Micelles

Abstract

A modified set-up for tip-enhanced Raman spectroscopy is proposed to extend conventional tip-enhanced Raman spectroscopy, beyond the dependence on near field optics. The mechanisms for enhancement have been proposed through comparisons to spectra from other enhanced Raman techniques. This technique allows for the characterization of a monolayer of PS-b-P2VP reverse micelles and paves a way for a promising technique in the characterization of …

Authors

Hui LS; Arbi RI; Turak A; Dittrich M

Volume

00

Pagination

pp. 1-2

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

May 28, 2020

DOI

10.1109/pn50013.2020.9166965

Name of conference

2020 Photonics North (PN)

Labels

Fields of Research (FoR)