Conference
Morphology, Electronic and Optical Properties of Si Nanowires
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006
Authors
Kim P-SG; Botton G; Sham T
Volume
12
Pagination
pp. 688-689
Publisher
Oxford University Press (OUP)
Publication Date
August 2006
DOI
10.1017/s1431927606065706
Conference proceedings
Microscopy and Microanalysis
Issue
S02
ISSN
1431-9276