Frequency-domain measurement of spontaneous emission lifetime in rare-earth-doped gain media

Abstract

The spontaneous emission lifetime in Al2O3:Tm³⁺ waveguides is measured to be 568 ± 48 μs, using a frequency-domain method. The method is studied and verified in Er³⁺-doped silica fiber, yielding a measured lifetime of 9.73 ± 0.08 ms.

Authors

Magden ES; Callahan PT; Li N; Shtyrkova K; Ruocco A; Singh N; Xin M; Vermeulen D; Bradley JDB; Leake G

Volume

Part F41-CLEO_SI 2017

Publication Date

January 1, 2017

DOI

10.1364/CLEO_SI.2017.SM1K.3

Conference proceedings

Optics Infobase Conference Papers

Associated Experts

Jonathan Bradley

Associate Professor, Faculty of Engineering

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