Conference
Design, Fabrication, and Characterization of Ultra-Wide Band TEM Horn for Microwave Imaging
Abstract
Authors
Amineh RK; Nikolova NK
Pagination
pp. 1-4
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
July 1, 2010
DOI
10.1109/antem.2010.5552478
Name of conference
2010 14th International Symposium on Antenna Technology and Applied Electromagnetics & the American Electromagnetics Conference