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Group-index birefringence and loss measurements in...
Journal article

Group-index birefringence and loss measurements in silicon-on-insulator photonic wire waveguides

Abstract

Group-index birefringence in silicon-on-insulator photonic wire waveguides is determined through a polarization beating technique and a Fabry-Pérot resonance method. A large group-index birefringence, up to 0.67, is obtained as a result of the structural asymmetry and high field confinement of our waveguides. The group index and linear propagation loss are also determined. In particular, the group index is found to be as large as 4.45 due to …

Authors

Duchesne D; Cheben P; Morandotti R; Lamontagne B; Xu D-X; Janz S; Christodoulides D

Journal

Optical Engineering, Vol. 46, No. 10,

Publisher

SPIE, the international society for optics and photonics

Publication Date

October 1, 2007

DOI

10.1117/1.2793711

ISSN

0091-3286