Conference
Framework for Watermark Robustness Adjustment Using Image Depth Map
Abstract
Authors
Mohaghegh H; Karimi N; Samavi S
Pagination
pp. 555-560
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
May 1, 2015
DOI
10.1109/iraniancee.2015.7146278
Name of conference
2015 23rd Iranian Conference on Electrical Engineering