Conference
About the origin and the mechanisms involved in the cracking of highly porous silicon layers under capillary stresses
Abstract
Authors
Belmont O; Faivre C; Bellet D; Brechet Y
Volume
276
Pagination
pp. 219-222
Publisher
Elsevier
Publication Date
April 15, 1996
DOI
10.1016/0040-6090(95)08057-0
Conference proceedings
Thin Solid Films
Issue
1-2
ISSN
0040-6090