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Quantitative evolution of electrical contact...
Conference

Quantitative evolution of electrical contact resistance between aluminum thin films

Authors

Mercier D; Mandrillon V; Holtz A; Volpi F; Verdier M; Brechet Y

Series

Electrical Contacts-IEEE Holm Conference on Electrical Contacts

Pagination

pp. 23-30

Publisher

IEEE

Publication Date

January 1, 2012

Name of conference

58th IEEE Holm Conference on Electrical Contacts (Holm)

Conference place

Portland, OR

Conference start date

September 23, 2012

Conference end date

September 26, 2012

Conference proceedings

2012 IEEE 58TH HOLM CONFERENCE ON ELECTRICAL CONTACTS (HOLM)

ISSN

1062-6808

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