Experts has a new look! Let us know what you think of the updates.

Provide feedback
Home
Scholarly Works
Stress induced damages in SiOC and porous SiOC...
Conference

Stress induced damages in SiOC and porous SiOC single via Kelvin structures investigation methodology, failure description and improved via barrier approaches

Authors

Fuchsmann A; Arnal V; Besling W; Brechet Y; Verdier M; Torres J

Editors

Erb D; Ramm P; Masu K; Osaki A

Pagination

pp. 259-263

Publisher

MATERIALS RESEARCH SOC

Publication Date

2004

ISBN-10

1-55899-814-4

Name of conference

21st Advanced Metallization Conference (AMC 2004)

Conference place

CA, San Diego

Conference start date

October 19, 2004

Conference end date

October 21, 2004

Conference proceedings

ADVANCED METALLIZATION CONFERENCE 2004 (AMC 2004)