Conference
Data-Driven Quality Control of Batch Processes via Subspace Identification
Abstract
In this work we present a novel, data-driven, quality modeling and control approach for batch processes. Specifically, we adapt subspace identification methods for use with batch data to identify a state-space model from available process measurements and input moves. We demonstrate that the resulting LTI, dynamic, state-space model is able to describe the transient behavior of finite duration batch processes. Next, we relate the terminal …
Authors
Corbett B; Mhaskar P
Pagination
pp. 4163-4168
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
July 1, 2016
DOI
10.1109/acc.2016.7525576
Name of conference
2016 American Control Conference (ACC)