Conference
Low-Frequency Noise in Semiconductor Devices-State-of-the-Art and Future Perspectives Plenary Paper
Abstract
Noise is both an asset and a hindrance. Noise as an asset represents a powerful non-destructive tool to study defects, track manufacturing processes and better understand aspects of charge transport in semiconductor devices. On the other hand, noise as an undesired, ever-present phenomenon, limits, for example, the sensitivity of electronic devices and the charge sensitivity of sensors and memory elements. In this plenary talk, we will present …
Authors
Deen MJ
Pagination
pp. 1-4
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2017
DOI
10.1109/icnf.2017.7985925
Name of conference
2017 International Conference on Noise and Fluctuations (ICNF)