Conference
Advances in Structural Characterization Using Soft X-ray Scanning Transmission Microscopy (STXM): Mapping and Measuring Porosity in PEM-FC Catalyst Layers
Abstract
Authors
Berejnov V; Saha M; Susac D; Stumper J; West M; Hitchcock AP
Volume
80
Pagination
pp. 241-252
Publisher
The Electrochemical Society
Publication Date
August 24, 2017
DOI
10.1149/08008.0241ecst
Conference proceedings
ECS Transactions
Issue
8
ISSN
1938-5862