Journal article
Defect sensitive etching of hexagonal boron nitride single crystals
Abstract
Defect sensitive etching (DSE) was developed to estimate the density of non-basal plane dislocations in hexagonal boron nitride (hBN) single crystals. The crystals employed in this study were precipitated by slowly cooling (2–4 °C/h) a nickel-chromium flux saturated with hBN from 1500 °C under 1 bar of flowing nitrogen. On the (0001) planes, hexagonal-shaped etch pits were formed by etching the crystals in a eutectic mixture of NaOH and KOH …
Authors
Edgar JH; Liu S; Hoffman T; Zhang Y; Twigg ME; Bassim ND; Liang S; Khan N
Journal
Journal of Applied Physics, Vol. 122, No. 22,
Publisher
AIP Publishing
Publication Date
December 14, 2017
DOI
10.1063/1.4997864
ISSN
0021-8979