Technical Note: Examination of Focused Ion Beam-Sectioned Surface Films Formed on AM60B Mg Alloy in an Aqueous Saline Solution

This technical note reports on relative differences in the physical and chemical nature of the surface films formed on AM60B during anodic polarization in an aqueous saline solution. Cross sections of the films prepared by focused ion beam (FIB) milling were analyzed using scanning electron microscopy coupled with energy-dispersive spectroscopy (SEM-EDS). The apparent breakdown potential (Eb) observed in the potentiodynamic anodic polarization …