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Optical spectroscopy of Er doped Si-nanocrystals...
Conference

Optical spectroscopy of Er doped Si-nanocrystals on sapphire substrates fabricated by ion implantation into SiO2

Authors

Hylton NP; Crowe IF; Knights AP; Halsall MP; Ruffell S; Gwilliam RM

Volume

7606

Publisher

SPIE, the international society for optics and photonics

Publication Date

February 11, 2010

DOI

10.1117/12.852922

Name of conference

Silicon Photonics V

Conference proceedings

Proceedings of SPIE--the International Society for Optical Engineering

ISSN

0277-786X
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