Conference
A novel method to characterize photorefractive damage in quasiphase-matched wavelength converters
Abstract
Authors
Xu CQ; Okayama H; Ogawa Y
Volume
71
Pagination
pp. 335-337
Publisher
AIP Publishing
Publication Date
February 1, 2000
DOI
10.1063/1.1150203
Conference proceedings
Review of Scientific Instruments
Issue
2
ISSN
0034-6748