Journal article
A hidden Markov model-based algorithm for fault diagnosis with partial and imperfect tests
Abstract
Authors
Ying J; Kirubarajan T; Pattipati KR; Patterson-Hine A
Journal
IEEE Transactions on Human-Machine Systems, Vol. 30, No. 4, pp. 463–473
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
December 1, 2000
DOI
10.1109/5326.897073
ISSN
2168-2291