Journal article
A hidden Markov model-based algorithm for fault diagnosis with partial and imperfect tests
Abstract
We present a hidden Markov model (HMM) based algorithm for fault diagnosis in systems with partial and imperfect tests. The HMM-based algorithm finds the most likely state evolution, given a sequence of uncertain test outcomes over time. We also present a method to estimate online the HMM parameters, namely, the state transition probabilities, the instantaneous probabilities of test outcomes given the system state and the initial state …
Authors
Ying J; Kirubarajan T; Pattipati KR; Patterson-Hine A
Journal
IEEE Transactions on Human-Machine Systems, Vol. 30, No. 4, pp. 463–473
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
2000
DOI
10.1109/5326.897073
ISSN
2168-2291