Conference
Multi-frequency Test Access Mechanism Design for Modular SOC Testing
Abstract
This paper investigates the applicability of multi-frequency test access mechanism (TAM) design for reducing the system-on-a-chip (SOC) test application time. Based on the bandwidth matching concept the proposed algorithms explore a larger solution space, which, as shown by experimental data, can lead to improved test application time.
Authors
Xu Q; Nicolici N
Pagination
pp. 2-7
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2004
DOI
10.1109/ats.2004.60
Name of conference
13th Asian Test Symposium