Journal article
Simultaneous reduction in volume of test data andpowerdissipation for systems-on-a-chip
Authors
Rosinger P; Gonciari PT; Al-Hashimi BM; Nicolici N
Journal
Electronics Letters, Vol. 37, No. 24, pp. 1434–1436
Publisher
Institution of Engineering and Technology (IET)
Publication Date
November 22, 2001
DOI
10.1049/el:20010981
ISSN
0013-5194