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Distributed Embedded Logic Analysis for Post-Silicon Validation of SOCs

Abstract

Post-silicon validation is used to identify design errors in silicon. Its main limitation is real-time observability of the circuit's internal nodes. In this paper, we introduce a novel design-for-debug architecture which automatically allocates distributed trace buffers to handle debug data acquisition requests from multiple sources located in different cores. Using resource-efficient and intelligent control placed on-chip, we show how real-time observability can be improved, thus helping bridge the gap between pre-silicon verification and post-silicon validation for SOC designs.

Authors

Ko HF; Kinsman AB; Nicolici N

Pagination

pp. 1-10

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

October 1, 2008

DOI

10.1109/test.2008.4700594

Name of conference

2008 IEEE International Test Conference
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