Conference
Distributed Embedded Logic Analysis for Post-Silicon Validation of SOCs
Abstract
Post-silicon validation is used to identify design errors in silicon. Its main limitation is real-time observability of the circuit's internal nodes. In this paper, we introduce a novel design-for-debug architecture which automatically allocates distributed trace buffers to handle debug data acquisition requests from multiple sources located in different cores. Using resource-efficient and intelligent control placed on-chip, we show how …
Authors
Ko HF; Kinsman AB; Nicolici N
Pagination
pp. 1-10
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
October 1, 2008
DOI
10.1109/test.2008.4700594
Name of conference
2008 IEEE International Test Conference