Conference
Automated data analysis solutions to silicon debug
Authors
Yu-Shen Yang; Nicolici N; Veneris A
Pagination
pp. 982-987
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
April 1, 2009
DOI
10.1109/date.2009.5090807
Name of conference
2009 Design, Automation & Test in Europe Conference & Exhibition