Conference
Design-for-debug for post-silicon validation: Can high-level descriptions help?
Abstract
Authors
Nicolici N; Ko HF
Pagination
pp. 172-175
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
November 1, 2009
DOI
10.1109/hldvt.2009.5340159
Name of conference
2009 IEEE International High Level Design Validation and Test Workshop