Conference
Tackling test trade-offs for BIST RTL data paths: BIST area overhead, test application time and power dissipation
Abstract
Power dissipation during test application is an emerging problem due to yield and reliability concerns. This paper focuses on BIST for RTL data paths and discusses testability trade-offs in terms of test application time, BIST area overhead and power dissipation. Using a complex validation flow and experimental data for over 30,000 testable data paths, it is shown how test application time decreases asymptotically when increasing power …
Authors
Nicolici N; Al-Hashimi BM
Pagination
pp. 72-81
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2001
DOI
10.1109/test.2001.966620
Name of conference
Proceedings International Test Conference 2001 (Cat. No.01CH37260)
Conference proceedings
International Test Conference 1999 Proceedings (IEEE Cat No99CH37034)
ISSN
1089-3539