Embedded Compact Deterministic Test for IP-Protected Cores

Motivated by the difficulty of implementing pseudo-random built-in self-test (BIST) to non-BIST-ready intellectual property (IP) cores, this paper introduces StreamBIST, a new low cost methodology for embedded deterministic test. By combining low overhead pseudo-random on-chip generation with external control for test pattern expansion, the proposed StreamBIST methodology provides maximum coverage for IP cores' compact and deterministic test …