Conference
Variable-Length Input Huffman Coding for System-on-a-Chip Test
Abstract
This paper presents a new compression method for embedded core-based system-on-a-chip test. In addition to the new compression method, this paper analyzes the three test data compression environment (TDCE) parameters: compression ratio, area overhead, and test application time, and explains the impact of the factors which influence these three parameters. The proposed method is based on a new variable-length input Huffman coding scheme, which …
Authors
Gonciari PT; Al-Hashimi BM; Nicolici N
Volume
22
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
6 2003
DOI
10.1109/tcad.2003.811451
Conference proceedings
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Issue
6
ISSN
0278-0070