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On Reducing Wrapper Boundary Register Cells in...
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On Reducing Wrapper Boundary Register Cells in Modular SOC Testing

Abstract

Motivated by the increasing area and performance overhead caused by wrapping the embedded cores for modular SOC testing, this paper proposes a solution for reducing the number of wrapper boundary register cells. Since the very purpose of core wrappers is to provide controllability and observability for the cores-under-test, it is shown how the number of wrapper boundary register cells can be reduced without affecting the test quality. While a …

Authors

Xu Q; Nicolici N

Volume

1

Pagination

pp. 622-631

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

January 1, 2003

DOI

10.1109/test.2003.1270889

Name of conference

International Test Conference, 2003. Proceedings. ITC 2003.

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