Conference
On Reducing Wrapper Boundary Register Cells in Modular SOC Testing
Abstract
Motivated by the increasing area and performance overhead caused by wrapping the embedded cores for modular SOC testing, this paper proposes a solution for reducing the number of wrapper boundary register cells. Since the very purpose of core wrappers is to provide controllability and observability for the cores-under-test, it is shown how the number of wrapper boundary register cells can be reduced without affecting the test quality. While a …
Authors
Xu Q; Nicolici N
Volume
1
Pagination
pp. 622-631
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2003
DOI
10.1109/test.2003.1270889
Name of conference
International Test Conference, 2003. Proceedings. ITC 2003.