Experts has a new look! Let us know what you think of the updates.

Provide feedback
Home
Scholarly Works
On-Chip Stimuli Generation for Post-Silicon...
Conference

On-Chip Stimuli Generation for Post-Silicon Validation

Abstract

In contrast to pre-silicon verification environments, in system validation is not strongly constrained by the number of stimuli that can be applied; rather, the quality of the patterns, as well as the observation of the events of interest are the real concern. This paper motivates the need for developing structured methods for porting the controllability aspects of pre-silicon verification into post-silicon validation environments. Use cases …

Authors

Nicolici N

Pagination

pp. 108-109

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

November 1, 2012

DOI

10.1109/hldvt.2012.6418251

Name of conference

2012 IEEE International High Level Design Validation and Test Workshop (HLDVT)

Labels