A methodology for automated design of embedded bit-flips detectors in post-silicon validation

Post-silicon validation is concerned with detecting design errors that escape to silicon prototypes and need to be fixed before committing to high-volume manufacturing. Electrical errors are particularly difficult to catch during the pre-silicon phase because of the insufficient accuracy of device models, which is often traded-off against simulation time. This challenge is further aggravated by the rising number of voltage domains, especially …