Conference
On-Chip Generation of Uniformly Distributed Constrained-Random Stimuli for Post-Silicon Validation
Abstract
Post-silicon validation is becoming widely adopted because it runs significantly faster than pre-silicon verification and hence it helps uncover subtle design errors that escape to silicon prototypes. However, it is hindered by limited controllability and observability, which makes it challenging to reuse pre-silicon content. In order to enable the reuse of stimuli constraints from pre-silicon verification environments, we present a method that …
Authors
Shi X; Nicolici N
Pagination
pp. 808-815
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
November 1, 2015
DOI
10.1109/iccad.2015.7372654
Name of conference
2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)