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On-Chip Generation of Uniformly Distributed Constrained-Random Stimuli for Post-Silicon Validation

Abstract

Post-silicon validation is becoming widely adopted because it runs significantly faster than pre-silicon verification and hence it helps uncover subtle design errors that escape to silicon prototypes. However, it is hindered by limited controllability and observability, which makes it challenging to reuse pre-silicon content. In order to enable the reuse of stimuli constraints from pre-silicon verification environments, we present a method that facilitates the on-chip generation of uniformly distributed constrained-random stimuli. More specifically, our method, which relies on new pre-processing steps and on-chip hardware features, can generate in real-time pseudo cyclic-random stimuli with no repetition until the space of the compliant stimuli is exhausted.

Authors

Shi X; Nicolici N

Pagination

pp. 808-815

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

November 1, 2015

DOI

10.1109/iccad.2015.7372654

Name of conference

2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
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