Bit-Flip Detection-Driven Selection of Trace Signals

Since integrating memory blocks on-chip became affordable, embedded logic analysis has been used extensively for post-silicon validation and debugging. Deciding at design time which signals to be traceable at the post-silicon phase, has been posed as an algorithmic problem a decade ago. The primary focus of the subsequent approaches on this topic was to restore as much data as possible within a software simulator in order to facilitate the …