Conference
On Supporting Sequential Constraints for On-Chip Generation of Post-Silicon Validation Stimuli
Abstract
Authors
Shi X; Nicolici N
Pagination
pp. 107-112
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
November 1, 2014
DOI
10.1109/ats.2014.30
Name of conference
2014 IEEE 23rd Asian Test Symposium