Conference
On Supporting Sequential Constraints for On-Chip Generation of Post-Silicon Validation Stimuli
Abstract
Post-silicon validation plays a critical role in exposing design errors in early silicon prototypes. Its effectiveness is conditioned by in-system application of functionally-compliant stimuli for extensive periods of time. This is achieved by expanding on-the-fly randomized functional sequences, which are subjected to user-programmable constraints. In this paper we present a method to extend the existing work for on-chip generation of …
Authors
Shi X; Nicolici N
Pagination
pp. 107-112
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
November 1, 2014
DOI
10.1109/ats.2014.30
Name of conference
2014 IEEE 23rd Asian Test Symposium