Journal article
Minimisation of power dissipation during test application in full-scan sequential circuits using primary input freezing
Authors
Nicolici N; Al-Hashimi BM; Williams AC
Journal
IET Computers & Digital Techniques, Vol. 147, No. 5,
Publisher
Institution of Engineering and Technology (IET)
Publication Date
2000
DOI
10.1049/ip-cdt:20000537
ISSN
1751-8601