Conference
Automated trace signals identification and state restoration for improving observability in post-silicon validation
Authors
Ko HF; Nicolici N
Series
Design Automation and Test in Europe Conference and Exhibition
Pagination
pp. 1140-1145
Publisher
IEEE
Publication Date
2008
ISBN-13
978-3-9810801-3-1
Name of conference
Design, Automation and Test in Europe Conference and Exhibition (DATE 08)
Conference place
GERMANY, Munich
Conference start date
March 10, 2008
Conference end date
March 14, 2008
Conference proceedings
2008 DESIGN, AUTOMATION AND TEST IN EUROPE, VOLS 1-3
ISSN
1530-1591