Conference
Embedded deterministic test exploiting care bit clustering and seed borrowing
Authors
Kinsman AB; Nicolici N
Pagination
pp. 832-837
Publisher
IEEE COMPUTER SOC
Publication Date
January 1, 2008
ISBN-13
978-0-7695-3117-5
DOI
10.1109/ISQED.2008.65
Name of conference
9th International Symposium on Quality Electronic Design
Conference place
San Jose, CA
Conference start date
March 17, 2008
Conference end date
March 19, 2008
Conference proceedings
ISQED 2008: PROCEEDINGS OF THE NINTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN