Conference
Compressed Embedded Diagnosis of Logic Cores
Abstract
This paper introduces a new method for deterministic diagnosis of logic cores. The proposed method is based on onchip decompression and comparison of incompletely specified test patterns and test responses. Using experimental data, the trade-offs between the number of tester channels, on-chip area and scan time are discussed.
Authors
Ollivierre S; Kinsman AB; Nicolici N
Pagination
pp. 534-539
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2004
DOI
10.1109/iccd.2004.1347973
Name of conference
IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings.