Journal article
FIB/TEM Investigation of crystallographic defects in type-II superlattice based infrared detectors
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Authors
Bassim N; Aifer A; Jackson E; Nolde J; Affouda C; Canedy C; Vurgaftman I; Meyer J; Maximenko S
Journal
Microscopy and Microanalysis, Vol. 18, No. S2, pp. 1806–1807
Publisher
Oxford University Press (OUP)
Publication Date
July 2012
DOI
10.1017/s1431927612010884
ISSN
1431-9276