Conference
Elevating Watermark Robustness by Data Diffusion in Contourlet Coefficients
Abstract
Authors
Kaviani HR; Samavi S; Karimi N; Shirani S
Volume
1
Pagination
pp. 6739-6743
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2012
DOI
10.1109/icc.2012.6364908
Name of conference
2012 IEEE International Conference on Communications (ICC)