Conference
Sensitivity Evaluation of Microwave Imaging Systems Employing Scattering-Parameter Measurements
Abstract
Authors
Moussakhani K; McCombe JJ; Nikolova NK
Pagination
pp. 7-8
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
July 1, 2014
DOI
10.1109/aps.2014.6904335
Name of conference
2014 IEEE Antennas and Propagation Society International Symposium (APSURSI)