Conference
Efficient TLM Sensitivity Analysis Exploiting Rubber Cells
Abstract
Authors
Basl PAW; Bakr MH; Nikolova NK
Pagination
pp. 53-56
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2008
DOI
10.1109/mwsym.2008.4633101
Name of conference
2008 IEEE MTT-S International Microwave Symposium Digest