Conference
Detection at Microwave Frequencies Based on Self-Adjoint Sensitivity Analysis
Abstract
Authors
Liu L; Trehan A; Nikolova NK
Pagination
pp. 189-192
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
May 1, 2010
DOI
10.1109/mwsym.2010.5514767
Name of conference
2010 IEEE MTT-S International Microwave Symposium