Low Frequency Noise in Contacted Single‐Wall Carbon Nanotube

Since their discovery, carbon nanotubes present many interesting electrical properties and can be candidates for future shrinking devices. Electrode realization on nanotubes remains a challenge. The deposited contacts must present interesting electrical parameters: low contact resistance, low series resistance, low parasitic capacity and low excess noise. The understanding of conduction phenomena induced into or near the metal/nanotube contact is necessary to improve the device. In this paper we present characterization of a Au‐Ti deposited contact on a single‐wall carbon nanotube. Steady‐state current‐voltage measurements, impedance and noise measurements lead to the frequency device characteristic. From this study a low frequency noise electrical model is presented. Using this model and the low frequency noise measurements, we show that the measured thermal noise has its origin in the electrode/nanotube contacts.