Home
Scholarly Works
Unique dc characteristics of a new gated lateral...
Conference

Unique dc characteristics of a new gated lateral pnp bipolar junction transistor (BJT) using 0.8 mu m BiCMOS technology

Authors

Deen MJ; Yan ZX

Volume

74

Pagination

pp. S189-S194

Publisher

NATL RESEARCH COUNCIL CANADA

Publication Date

January 1, 1996

Name of conference

7th Canadian Semiconductor Technology Conference

Conference place

CHATEAU LAURIER, OTTAWA, CANADA

Conference start date

August 14, 1995

Conference end date

August 18, 1995

Conference proceedings

CANADIAN JOURNAL OF PHYSICS

ISSN

0008-4204

Labels

Contact the Experts team