Signal and noise modeling and analysis of complementary metal-oxide semiconductor active pixel sensors

The active pixel sensor (APS) structure is the most common pixel element for photodetection systems in standard complementary metal-oxide semiconductor technology. The focus of our work is on finding functional characteristics for low-light level design. Shot, reset, thermal, and 1∕f noise sources are considered in APS noise modeling. We also consider a higher-order empirical model for the p-n junction capacitance to accurately calculate the …