Conference
Ionization coefficient measurements in InP by using multiplication noise characteristics of InP/InGaAs separate absorption, grading, charge, and multiplication (SAGCM) avalanche photodiodes (APDs)
Authors
An S; Clark WR; Deen MJ; Vetter AS; Svilans M
Volume
3287
Pagination
pp. 48-59
Publisher
SPIE, the international society for optics and photonics
Publication Date
April 8, 1998
DOI
10.1117/12.304505
Name of conference
Photodetectors: Materials and Devices III
Conference proceedings
Proceedings of SPIE--the International Society for Optical Engineering
ISSN
0277-786X